X-Ray Flourescence Techniques
X-Ray Fluoresence (XRF) has proven to be a very accurate analytical technique for a wide range of base metals, trace elements and major constituents found in rocks and mineral materials. There are two basic methods for preparing samples for XRF measurement, these being pressed powder and glass fusion. Pressed powder techniques are usually used for trace level analysis. The glass fusion techniques are used for high accuracy major element composition.
Silicate Fusion (Method Code : XRF202)
| SiO2 (0.01 %) | Al203 (0.01 %) | BaO (0.01 %) | Bi (0.001 %) | CaO (0.01 %) |
| Ce2O3 (0.001 %) | Co (0.001 %) | Cr203 (0.001 %) | Cu (0.001 %) | Fe2O3 (0.01 %) |
| HfO2 (0.01 %) | K2O (0.01 %) | MgO (0.01 %) | MnO (0.01 %) | Na2O (0.01 %) |
| Nb2O5 (0.001 %) | Ni (0.001 %) | P2O5 (0.001 %) | Pb (0.001 %) | Rb2O (0.01 %) |
| Sb2O3 (0.01 %) | SnO2 (0.01 %) | SO3 (0.001 %) | Ta2O5 (0.01 %) | SrO (0.01 %) |
| Th (0.001 %) | TiO2 (0.01 %) | V2O5 (0.01 %) | WO3 (0.01 %) | U (0.001 %) |
| Zn (0.001 %) | ZrO2 (0.01 %) |
Lithium Tetraborate Fusion (Method Code : XRF201)
| Ba (10 ppm) |  Cr (10 ppm) |
Cs (10 ppm) |
Nb (10 ppm) |
Rb (10 ppm) |
| Sn (10 ppm) | Ta (10 ppm) |
Ti (10 ppm) |
W (50 ppm) |